Correlations between structural and optical properties of GaInNAs quantum wells grown by MBE

Journal of Crystal Growth

Volumn 251, Issue 1-4, 2003, Pages 383-387

  Chauveau, J M ^a   Trampert, A ^a   Pinault, M A ^b   Tournie E ^b   Du, K ^c   Ploog, K H ^a  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^b CRHEA CNRS   (France)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

A1. Atomic force microscopy; A1. Composition modulation; A1. High resolution X ray diffraction; A1. Transmission electron microscopy; A3. Molecular beam epitaxy

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION; GALLIUM ALLOYS; HETEROJUNCTIONS; MOLECULAR BEAM EPITAXY; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

STRUCTURAL PROPERTIES;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0037381425     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)02182-6     Document Type: Conference Paper

References (12)

1. Kondow M., Kitatani T., Nakatsuka S., Larson M.C., Nakahara K., Yazawa Y., Okai M. IEEE J. Sel. Top. Quantum Electron. 3:1997;719.
2. Kurtz S.R., Allerman A.A., Jones E.D., Gee J.M., Banas J.J. Appl. Phys. Lett. 74:1999;729.
3. Wei S.-H., Zunger A. Phys. Rev. Lett. 76:1996;664.
4. Tournié E., Pinault M.-A., Vézian S., Massies J., Tottereau O. Appl. Phys. Lett. 77:2000;2189.
5. Sopanen M., Xin H.P., Tu C.W. Appl. Phys. Lett. 76:2000;994.
6. Tournié E., Pinault M.-A., Guzmán A. Appl. Phys. Lett. 80:2002;4148.
7. Bithell E.G., Stobbs W.M. Philos. Mag. A. 60:1989;39.
8. Grillo V., Albrecht M., Remmele T., Strunk H.P., Egorov A.Y., Riechert H. J. Appl. Phys. 90:2001;3792.
9. J.-M. Chauveau, A. Trampert, K.H. Ploog, M.-A. Pinault, E. Tournié, unpublished.
10. Asomoza R., Elyukhin V.A., Pena-Sierra R. Appl. Phys. Lett. 81:2002;1785.
11. Largeau L., Bondoux C., Patriarche G., Asplund C., Fujioka A., Salomonsson F., Hammar M. Appl. Phys. Lett. 79:2001;1795.
12. Du K., Rau Y., Jin-Phillipp N.Y., Phillipp F. J. Mater. Sci. Technol. 18:2002;135.