Performance comparison of VLV, ULV, and ECR tests

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 19, Issue 2, 2003, Pages 137-147

  Jiang, Wanli ^a   Peterson, Eric ^a  

^a BOSTON SCIENTIFIC CORPORATION   (United States)

Author keywords

Dynamic current test; Test effectiveness; Test efficiency; Test threshold; Very low voltage test

Indexed keywords

BIOMEDICAL EQUIPMENT; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRONICS INDUSTRY; FAILURE ANALYSIS;

DYNAMIC CURRENT TEST; ENERGY CONSUMPTION RATIO TEST; ULTRA LOW VOLTAGE TEST; VERY LOW VOLTAGE TEST;

INTEGRATED CIRCUIT TESTING;

EID: 0037378653     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022881322125     Document Type: Article

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