|
Volumn 202, Issue , 2003, Pages 51-55
|
Stacking fault tetrahedra formation in the neighbourhood of grain boundaries
|
Author keywords
Grain boundaries; Molecular dynamics; Nanocrystalline materials; Radiation damage; Stacking fault tetrahedra
|
Indexed keywords
COMPUTER SIMULATION;
GRAIN BOUNDARIES;
NANOSTRUCTURED MATERIALS;
RADIATION DAMAGE;
STACKING FAULTS;
TRUNCATED STACKING FAULT TETRAHEDRA (TSFT);
MOLECULAR DYNAMICS;
|
EID: 0037377259
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)01829-3 Document Type: Conference Paper |
Times cited : (29)
|
References (28)
|