Electron-spectroscopy and -diffraction study of the conductivity of CVD diamond (0 0 1) 2 × 1 surface

Surface Science

Volumn 529, Issue 1-2, 2003, Pages 180-188

  Kono, S ^a   Takano, T ^a   Shimomura, M ^a,c   Goto, T ^a   Sato, K ^a   Abukawa, T ^a   Tachiki, M ^d   Kawarada, H ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b WASEDA UNIVERSITY   (Japan)

^c SHIZUOKA UNIVERSITY   (Japan)

^d NONE

Author keywords

Auger electron diffraction; Auger electron spectroscopy; Chemical vapor deposition; Diamond; Surface electrical transport (Surface conductivity, Surface recombination, etc.); X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; DIAMONDS; FERMI LEVEL; LOW ENERGY ELECTRON DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER ELECTRON DIFFRACTION;

SURFACE PROPERTIES;

EID: 0037376814     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00241-3     Document Type: Article

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