Anelastic compression of nanometer-sized silica particles under high pressure: A high-energy x-ray diffraction measurement

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 9, 2003, Pages

  Uchino, T ^a,b   Sakoh, A ^c   Azuma, M ^b,c   Kohara, S ^d   Takahashi, M ^c   Takano, M ^c   Yoko, T ^c  

^a KOBE UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c KYOTO UNIVERSITY   (Japan)

^d JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE;

ARTICLE; CHEMICAL ANALYSIS; COMPRESSION; CORRELATION FUNCTION; ENERGY; NANOPARTICLE; PARTICLE SIZE; PRESSURE; ROOM TEMPERATURE; X RAY DIFFRACTION;

EID: 0037367971     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.092202     Document Type: Article

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