Induced Fe and Mn magnetic moments in Co-FeMn bilayers on Cu(001)

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 9, 2003, Pages

  Offi, F ^a   Kuch, W ^a   Chelaru, L I ^a   Fukumoto, K ^a   Kotsugi, M ^a   Kirschner, J ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; COPPER; FERROMAGNETIC MATERIAL; IRON; MANGANESE;

ARTICLE; CIRCULAR DICHROISM; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; FILM; MAGNETISM; MOLECULAR INTERACTION; THICKNESS; X RAY;

EID: 0037367478     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.094419     Document Type: Article

References (38)

1. J. Nogués and I K. Schuller, J. Magn. Magn. Mater.192, 203 (1999).
2. M. Kiwi, J. Magn. Magn. Mater.234, 584 (2001).
3. J C S. Kools, IEEE Trans. Magn.32, 3165 (1996).
4. W H. Meiklejohn and C P. Bean, Phys. Rev.105, 904 (1957).
5. T C. Schulthess and W H. Butler, J. Appl. Phys.85, 5510 (1999).
6. K. Takano, R H. Kodama, A E. Berkowitz, W. Cao, and G. Thomas, Phys. Rev. Lett.79, 1130 (1997).
7. W J. Antel, Jr., F. Perjeru, and G R. Harp, Phys. Rev. Lett.83, 1439 (1999).
8. C. Sánchez-Hanke and C.-C. Kao, J. Magn. Magn. Mater.226-230, 1803 (2001).
9. H. Ohldag, T J. Regan, J. Stöhr, A. Scholl, F. Nolting, J. Lüning, C. Stamm, S. Anders, and R L. White, Phys. Rev. Lett.87, 247201 (2001).
10. R. Nakajima, J. Stöhr, and Y U. Idzerda, Phys. Rev. B59, 6421 (1999).
11. F. Nolting, A. Scholl, J. Stöhr, J W. Seo, J. Fompeyrine, H. Slegwart, J P. Locquet, J. Lüning, E E. Fullerton, M F. Toney, M R. Scheinfein, and H A. Padmore, Nature (London)405, 767 (2000).
12. J. Stöhr, A. Scholl, T J. Regan, S. Anders, J. Lüning, M R. Scheinfein, H A. Padmore, and R L. White, Phys. Rev. Lett.83, 1862 (1999).
13. H. Ohldag, A. Scholl, F. Nolting, S. Anders, F U. Hillebrecht, and J. Stöhr, Phys. Rev. Lett.86, 2878 (2001).
14. F. Offi, W. Kuch, and J. Kirschner, Phys. Rev. B66, 064419 (2002).
15. W. Kuch, J. Gilles, F. Offi, S S. Kang, S. Imada, S. Suga, and J. Kirschner, J. Electron Spectrosc. Relat. Phenom.109, 249 (2000).
16. J. Stöhr, H A. Padmore, S. Anders, T. Stammler, and M R. Scheinfein, Surf. Rev. Lett.5, 1297 (1998).
17. W. Swiech, G H. Fecher, Ch. Ziethen, O. Schmidt, G. Schönhense, K. Grzelakowski, C M. Schneider, R. Frömter, H P. Oepen, and J. Kirschner, J. Electron Spectrosc. Relat. Phenom.84, 171 (1997).
18. C M. Schneider, J. Magn. Magn. Mater.175, 160 (1997).
19. W. Kuch, R. Frömter, J. Gilles, D. Hartmann, C. Ziethen, C M. Schneider, G. Schönhense, W. Swiech, and J. Kirschner, Surf. Rev. Lett.5, 1241 (1998).
20. H. Umebayashi and Y. Ishikawa, J. Phys. Soc. Jpn.21, 1281 (1966).
21. W. Kuch, F. Offi, L I. Chelaru, M. Kotsugi, K. Fukumoto, and J. Kirschner, Phys. Rev. B65, 140408 (2002).
22. The Fe/W(001) sample was imaged with similar PEEM and beamline settings as the (formula presented) bilayers.
23. From Eq. (2) one may calculate that a variation of (formula presented) from 10 Å to 100 Å leads to a variation of (formula presented) from 0.2 ML to 0.4 ML, respectively.
24. Y. Endoh and Y. Ishikawa, J. Phys. Soc. Jpn.30, 1614 (1971).
25. U. Gradmann and R. Bergholz, Phys. Rev. Lett.52, 771 (1984).
26. A. Scherz, H. Wende, P. Poulopoulos, J. Lindner, K. Baberschke, P. Blomquist, R. Wäppling, F. Wilhelm, and N B. Brookes, Phys. Rev. B64, 180407 (2001).
27. S. Ferrer, J. Alvarez, X. Torrelles, E. Lundgren, and P. Fajardo, Physica B248, 9 (1998).
28. M G. Samant, J. Stöhr, S S P. Parkin, G A. Held, B D. Hermsmeier, F. Herman, M. van Schilfgaarde, L.-C. Duda, D C. Mancini, N. Wassdahl, and R. Nakajima, Phys. Rev. Lett.72, 1112 (1994).
29. W. Kuch, M. Salvietti, X. Gao, M.-T. Lin, M. Klaua, J. Barthel, Ch.V. Mohan, and J. Kirschner, Phys. Rev. B58, 8556 (1998).
30. D. Spišák and J. Hafner, Phys. Rev. B61, 11 569 (2000).
31. see, for example, S. Andrieu, M. Finazzi, Ph. Bauer, H. Fischer, P. Lefevre, A. Traverse, K. Hricovini, G. Krill, and M. Piecuch, Phys. Rev. B57, 1985 (1998), and references therein.
32. see, for example, T. Igel, R. Pfandzelter, and H. Winter, Phys. Rev. B58, 2430 (1998), and references therein.
33. O. Rader, C. Pampuch, W. Gudat, A. Dallmeyer, C. Carbone, and W. Eberhardt, Europhys. Lett.46, 231 (1999).
34. S. Banerjee, W L. O’Brien, and B P. Tonner, J. Magn. Magn. Mater.198-199, 267 (1999).
35. A. Déchelette, J M. Tonnerre, M C. Saint Lager, F. Bartolomé, L. Sève, D. Raoux, H. Fischer, M. Piecuch, V. Chakarian, and C C. Kao, Phys. Rev. B60, 6636 (1999).
36. Magnetic contrast by using a PEEM in threshold photoemission has been actually demonstrated by G K L. Marx, H J. Elmers, and G. Schönhense, Phys. Rev. Lett.84, 5888 (2000), for FM materials;
37. and N B. Weber, C. Bethke, and F U. Hillebrecht, J. Magn. Magn. Mater.226-230, 1573 (2001), for AFM materials. In both cases, however, magnetic contrast was obtained from the asymmetry of two images and it was lower than the corresponding magnetic contrast after excitation at the core level edges.
38. D.P. Woodruff and T.A. Delchar, Modern Techniques of Surface Science, 2nd ed. (Cambridge University Press, Cambridge, 1994), p. 461 and following.