Latent class model diagnosis from a frequentist point of view

Biometrics

Volumn 59, Issue 1, 2003, Pages 189-196

  Formann, Anton K ^a  

^a UNIVERSITY OF VIENNA   (Austria)

Author keywords

Goodness of fit; Identifiability; Model diagnosis; Parametric bootstrap; Restricted latent class models

Indexed keywords

BAYESIAN FRAMEWORKS; EMPIRICAL DATA; FREQUENTIST; GOODNESS OF FIT; GRAPHICAL METHODS; IDENTIFIABILITY; LATENT CLASS MODEL; MODEL DIAGNOSIS; PARAMETRIC BOOTSTRAP; RESTRICTED LATENT CLASS MODEL;

BAYESIAN ANALYSIS; BOOTSTRAPPING;

ALGORITHM; BIOSTATISTICS; DEPRESSION; HUMAN; MENTAL DISEASE; PSYCHIATRIC DIAGNOSIS; REVIEW; STATISTICAL ANALYSIS; STATISTICAL MODEL; STATISTICAL PARAMETERS;

EID: 0037366796     PISSN: 0006341X     EISSN: None     Source Type: Journal    
DOI: 10.1111/1541-0420.00023     Document Type: Review

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