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Volumn 67, Issue 9, 2003, Pages 925081-925084

X-ray diffraction measurements of the c-axis Debye-Waller factors of YBa2Cu3O7 and HgBa2CaCu2O6

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM; CALCIUM; COPPER; MERCURY; OXYGEN; YTTRIUM;

EID: 0037366422     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (19)
  • 14
    • 33646601559 scopus 로고    scopus 로고
    • note
    • 4 substrates which have a cubic structure. The result is that the substrate peaks, which are much stronger, overlap with the peaks from the film, making those film samples useless for our experiments.
  • 15
    • 33646618338 scopus 로고    scopus 로고
    • note
    • This formula holds true only for monatomic systems. For polyatomic compounds, it is more complicated. See the discussion that follows later in the text.
  • 16
    • 33646625293 scopus 로고    scopus 로고
    • note
    • The fluctuations in Figs. 2(b) and 2(d) are not from the statistical shot noise in the counts but are mostly due to extrinsic effects such as the thermal motion of the sample as discussed in the text. The size of the error bar based on our experience is 0.5% or less. All of the root-mean-square errors of the data are less than 0.5%.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.