Room temperature deformation behavior of the Hf-V-Ta C15 Laves phase

Intermetallics

Volumn 11, Issue 3, 2003, Pages 257-267

  Kim, Won Yong ^a,b   Luzzi, David E ^a   Pope, David P ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b Korea Inst of Industrial Technology   (Japan)

Author keywords

A. Laves phase; B. Yield stress

Indexed keywords

COMPRESSION TESTING; DEFORMATION; DUCTILITY; MICROSTRUCTURE; OXIDATION RESISTANCE; PHASE DIAGRAMS; SCANNING ELECTRON MICROSCOPY; SOLID SOLUTIONS; TERNARY SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY; VOLUME FRACTION; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS; YIELD STRESS;

LAVES PHASES; MELTING POINT;

HAFNIUM ALLOYS;

EID: 0037364897     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0966-9795(02)00246-7     Document Type: Article

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