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Volumn 51, Issue 3, 2003, Pages 978-985

Accurate and direct characterization of high-q microwave resonators using one-port measurement

Author keywords

Critical points method; High Q resonator; One port measurement

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER SIMULATION; DIELECTRIC DEVICES; ELECTRIC NETWORK ANALYZERS; EQUIVALENT CIRCUITS; MICROWAVE DEVICES; NATURAL FREQUENCIES; Q FACTOR MEASUREMENT;

EID: 0037361246     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2003.808711     Document Type: Article
Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.