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Volumn 19, Issue 3, 2003, Pages 415-418
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Forensic discrimination of lead-tin solder based on the trace impurity analysis by ICP-AES
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC EMISSION SPECTROSCOPY;
CHLORINE COMPOUNDS;
COPPER;
FORENSIC SCIENCE;
INDUCTIVELY COUPLED PLASMA;
SOLDERING;
TIN;
COPPER CONCENTRATION;
DIFFERENT ORIGINS;
INDUCTIVELY COUPLED PLASMA-ATOMIC EMISSION SPECTROMETRY;
LEAD-TIN SOLDERS;
NIST STANDARDS;
OBSERVED VALUES;
PURIFIED WATER;
TRACE IMPURITIES;
TRACE ELEMENTS;
ANTIMONY;
ARSENIC;
BISMUTH;
COPPER;
GLASS;
HYDROCHLORIC ACID;
LEAD;
NITRIC ACID;
SILVER;
TIN;
TRACE ELEMENT;
WATER;
ACCURACY;
ARTICLE;
ATOMIC EMISSION SPECTROMETRY;
CHEMICAL ANALYSIS;
COLD EXPOSURE;
COOLING;
DILUTION;
HEAT;
ROOM TEMPERATURE;
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EID: 0037356482
PISSN: 09106340
EISSN: None
Source Type: Journal
DOI: 10.2116/analsci.19.415 Document Type: Article |
Times cited : (16)
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References (13)
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