Diagnosis of edge localized mode evolution in DIII-D using fast-gated CID and infrared cameras

Review of Scientific Instruments

Volumn 74, Issue 3 II, 2003, Pages 2064-2067

  Groth, M ^a,d   Fenstermacher, M E ^a   Lasnier, C J ^a   Hernandez, R ^b   Moller, J M ^a   Sturz, R A ^c  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Xybion Electronic Systems Corp   (United States)

^d GENERAL ATOMICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA PROCESSING; HEAT FLUX; PHOTONS; REGRESSION ANALYSIS; THERMOCOUPLES; TOKAMAK DEVICES;

PLASMA DISCHARGES;

INFRARED DEVICES;

EID: 0037355786     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1537037     Document Type: Conference Paper

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