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Volumn 76, Issue 5, 2003, Pages 773-780

Ion-beam mixing in Fe/Si bilayers by singly and highly charged ions: Evolution of phases, spike mechanism and possible effects of the ion-charge state

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); ION IMPLANTATION; IONS; IRON; IRRADIATION; MOSSBAUER SPECTROSCOPY; PHASE COMPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON COMPOUNDS; SOLID SOLUTIONS; X RAY DIFFRACTION ANALYSIS;

EID: 0037355735     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-002-2045-9     Document Type: Article
Times cited : (35)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.