Overview of optical techniques that measure displacements: Murray lecture

Experimental Mechanics

Volumn 43, Issue 1, 2003, Pages 1-19

  Sciammarella, Cesar A ^a  

^a Illinois Institute of Technology   (United States)

Author keywords

Electro optic holography; Fourier analysis of fringe patterns; Holographic moir ; Holography; Moir ; Moir holography; Optical techniques to measure displacements; Speckle interferometry

Indexed keywords

COMPUTATIONAL METHODS; DATA PROCESSING; INFORMATION ANALYSIS; MATHEMATICAL MODELS; SENSITIVITY ANALYSIS;

FRINGE INFORMATIONS;

OPTICAL SYSTEMS;

DISPLACEMENT; OPTICAL TECHNIQUE;

EID: 0037354903     PISSN: 00144851     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02410478     Document Type: Article

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