Charged particle-induced gamma excitation as a possible diagnostic technique for escaping MeV ions on ITER

Review of Scientific Instruments

Volumn 74, Issue 3, 2003, Pages 1726-1729

  Bonheure, G ^a   Van Wassenhove, G ^a  

^a ROYAL MILITARY ACADEMY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EXPERIMENTAL REACTORS; GAMMA RAY SPECTROMETERS; GAMMA RAYS; MONTE CARLO METHODS; SIGNAL TO NOISE RATIO;

TIME RESOLVED MEASUREMENTS;

CHARGED PARTICLES;

EID: 0037352414     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1538363     Document Type: Article

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