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Volumn 93, Issue 5, 2003, Pages 2828-2833

Magnetic force microscopy of skew angle dependencies in perpendicular magnetic recording

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; COBALT ALLOYS; ION BEAMS; MICROSCOPIC EXAMINATION;

EID: 0037352228     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1544069     Document Type: Article
Times cited : (7)

References (13)
  • 1
    • 0023439171 scopus 로고
    • M. H. Kryder, Sci. Am. 117, 116-125 (1987).
    • (1987) Sci. Am. , vol.117 , pp. 116-125
    • Kryder, M.H.1
  • 11
    • 0035476181 scopus 로고    scopus 로고
    • S. E. Lambert, B. M. Lairson, H. Nguy, L. Nguyen, T. Huang, J. Adler, and S. Gopalaswamy, J. Magn. Magn. Mater. 235, 245 (2001); D. Thompson, J. Magn. Soc. Jpn. 21, 9 (1997).
    • (1997) J. Magn. Soc. Jpn. , vol.21 , pp. 9
    • Thompson, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.