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Volumn 93, Issue 5, 2003, Pages 2828-2833
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Magnetic force microscopy of skew angle dependencies in perpendicular magnetic recording
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Author keywords
[No Author keywords available]
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Indexed keywords
BOUNDARY ELEMENT METHOD;
COBALT ALLOYS;
ION BEAMS;
MICROSCOPIC EXAMINATION;
SKEW ANGLE;
MAGNETIC RECORDING;
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EID: 0037352228
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1544069 Document Type: Article |
Times cited : (7)
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References (13)
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