Determining interfacial thermal residual stress in SiC/Ti-15-3 composites

Scripta Materialia

Volumn 48, Issue 6, 2003, Pages 701-706

  Xing, Y M ^a   Tanaka, Y ^a   Kishimoto, S ^a   Shinya, N ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Electron moir method; Interfaces; MMC; Residual stresses

Indexed keywords

COMPRESSIVE STRESS; ELECTRONS; INTERFACES (MATERIALS); RESIDUAL STRESSES; SILICON CARBIDE; THERMAL STRESS;

THERMAL RESIDUAL STRESS;

FIBER REINFORCED MATERIALS;

EID: 0037349066     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(02)00554-7     Document Type: Article

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