SCOPUS 정보 검색 플랫폼

Superconductor Science and Technology

Volumn 16, Issue 3, 2003, Pages 412-415

Surface resistance measurements of surface and interface sides of YBa2Cu3O7 films on sapphire and LaAlO3

(3) Jacob, Mohan V a Mazierska, Janina a Lorenz, Michael b

a JAMES COOK UNIVERSITY (Australia)

b UNIVERSITY OF LEIPZIG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE MEASUREMENT; INTERFACES (MATERIALS); LANTHANUM COMPOUNDS; PULSED LASER DEPOSITION; RESONATORS; SAPPHIRE; SILVER; SUBSTRATES; SUPERCONDUCTING FILMS; SURFACES; TEMPERATURE;

DIELECTRIC RESONATOR; LANTHANUM ALUMINATE SUBSTRATES; SURFACE RESISTANCE; SURFACE RESISTANCE MEASUREMENTS;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0037348730 PISSN: 09532048 EISSN: None Source Type: Journal
DOI: 10.1088/0953-2048/16/3/315 Document Type: Article

Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.