High-throughput, high-resolution Kirkpatrick-Baez microscope for advanced streaked imaging of ICF experiments on OMEGA

Review of Scientific Instruments

Volumn 74, Issue 3 II, 2003, Pages 2178-2181

  Gotchev, O V ^a   Jaanimagi, P A ^a   Knauer, J P ^a   Marshall, F J ^a   Meyerhofer, D D ^a   Bassett, N L ^a   Oliver, J B ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; HYDRODYNAMICS; IMAGING TECHNIQUES; STREAK CAMERAS; X RAY MICROSCOPES;

STREAKED IMAGING;

PLASMA DIAGNOSTICS;

EID: 0037348415     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1537864     Document Type: Conference Paper

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