X-ray photoelectron spectroscopy study of lanthanum-substituted bismuth titanate thin film

Journal of Materials Science Letters

Volumn 22, Issue 5, 2003, Pages 345-347

  Zhang, Y ^a,b   Wang, H ^a   Hou, Y ^a   Shang, S X ^a   Xu, X H ^a   Wang, M ^a   Qi, S K ^c  

^a SHANDONG UNIVERSITY   (China)

^b Shandong Institute of Education   (China)

^c LANZHOU INSTITUTE OF CHEMICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; DECOMPOSITION; LANTHANUM; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

METALORGANIC DECOMPOSITION (MOD);

THIN FILMS;

EID: 0037346279     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022684807977     Document Type: Article

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