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Volumn 313-316, Issue SUPPL., 2003, Pages 491-495

Non-destructive tritium measurements of Mk IIA divertor tile by BIXS

Author keywords

ray induced X ray spectrometry; Amount and depth profile of tritium; JET divertor tiles; Metallic impurities; Non destructive measurement

Indexed keywords

CARBON FIBERS; COMPOSITE MATERIALS; DEPOSITION; FUSION REACTOR DIVERTORS; MASS SPECTROMETERS; NONDESTRUCTIVE EXAMINATION; PLASMA THEORY; TRITIUM; X RAY SPECTROSCOPY;

EID: 0037345076     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(02)01380-6     Document Type: Conference Paper
Times cited : (19)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.