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Volumn 313-316, Issue SUPPL., 2003, Pages 491-495
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Non-destructive tritium measurements of Mk IIA divertor tile by BIXS
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Author keywords
ray induced X ray spectrometry; Amount and depth profile of tritium; JET divertor tiles; Metallic impurities; Non destructive measurement
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Indexed keywords
CARBON FIBERS;
COMPOSITE MATERIALS;
DEPOSITION;
FUSION REACTOR DIVERTORS;
MASS SPECTROMETERS;
NONDESTRUCTIVE EXAMINATION;
PLASMA THEORY;
TRITIUM;
X RAY SPECTROSCOPY;
DIVERTOR TILES;
TOKAMAK DEVICES;
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EID: 0037345076
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3115(02)01380-6 Document Type: Conference Paper |
Times cited : (19)
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References (15)
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