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Volumn 20, Issue 2, 2003, Pages 49-51
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Statistical process control: What you don't measure can hurt you!
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SOFTWARE;
MANUFACTURE;
PROCESS CONTROL;
QUALITY ASSURANCE;
SOFTWARE ENGINEERING;
STATISTICAL PROCESS CONTROL (SPC);
STATISTICAL METHODS;
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EID: 0037343199
PISSN: 07407459
EISSN: None
Source Type: Journal
DOI: 10.1109/MS.2003.1184166 Document Type: Article |
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Times cited : (15)
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References (0)
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