Outlier modeling in image matching

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 25, Issue 3, 2003, Pages 301-315

  Hasler, David ^a   Sbaiz, Luciano ^b   Süsstrunk, Sabine ^c   Vetterli, Martin ^c  

^a LOGO GmbH   (Germany)

^b Dartfish SA   (Switzerland)

^c EPFL   (Switzerland)

Author keywords

M estimators; Mixture model; Outlier model; Outlier rejection; Robust pose estimation

Indexed keywords

CAMERAS; ERRORS; PARAMETER ESTIMATION; PROBLEM SOLVING; ROBUSTNESS (CONTROL SYSTEMS);

IMAGE MATCHING;

IMAGE PROCESSING;

EID: 0037341418     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2003.1182094     Document Type: Article

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