Quasi-analytic steady-state solution of VCSEL rate equations including spatial hole burning and carrier diffusion losses

International Journal of Numerical Modelling: Electronic Networks, Devices and Fields

Volumn 16, Issue 2, 2003, Pages 143-159

  Jungo, Marc ^a   Erni, Daniel ^a   Baechtold, Werner ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

Carrier diffusion; Differential quantum efficiency; Rate equations; Spatial hole burning; Threshold current; VCSEL

Indexed keywords

CHARGE CARRIERS; DIFFUSION; ELECTRIC CURRENTS; OPTICAL INTERCONNECTS; POLYNOMIALS; THRESHOLD VOLTAGE;

SPATIAL HOLE BURNING;

LASERS;

EID: 0037339985     PISSN: 08943370     EISSN: None     Source Type: Journal    
DOI: 10.1002/jnm.490     Document Type: Article

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