|
Volumn 16, Issue 3-4, 2003, Pages 505-508
|
Ion-beam irradiation effect on solid-phase growth of β-FeSi2
|
Author keywords
FeSi2; Atomic mixing; Nano fabrication; Pre amorphization
|
Indexed keywords
ANNEALING;
ARGON;
AUGER ELECTRON SPECTROSCOPY;
ENERGY GAP;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
ION BEAMS;
IRRADIATION;
NANOTECHNOLOGY;
PHASE TRANSITIONS;
POSITIVE IONS;
SEMICONDUCTOR GROWTH;
SILICON WAFERS;
X RAY DIFFRACTION ANALYSIS;
ATOMIC MIXING;
IRON COMPOUNDS;
|
EID: 0037336985
PISSN: 13869477
EISSN: None
Source Type: Journal
DOI: 10.1016/S1386-9477(02)00641-0 Document Type: Conference Paper |
Times cited : (9)
|
References (13)
|