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Volumn 52, Issue 1, 2003, Pages 69-74

A simple goodness-of-fit test for the power-law process, based on the Duane plot

Author keywords

Duane plot; Goodness of fit test; Power law process; Regression analysis; Reliability growth; Repairable system; Simulation

Indexed keywords

COMPUTER SIMULATION; DECISION MAKING; GRAPHIC METHODS; PARAMETER ESTIMATION;

EID: 0037333294     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2002.805784     Document Type: Article
Times cited : (42)

References (26)
  • 1
    • 0019050186 scopus 로고
    • Inferences on the parameters and current system reliability for a time truncated Weibull process
    • L. J. Bain and M. Engelhardt, "Inferences on the parameters and current system reliability for a time truncated Weibull process," Technometrics, vol. 22, pp. 421-426, 1980.
    • (1980) Technometrics , vol.22 , pp. 421-426
    • Bain, L.J.1    Engelhardt, M.2
  • 2
    • 0000454651 scopus 로고    scopus 로고
    • Some new tests of the power law process
    • R. D. Baker, "Some new tests of the power law process," Technometrics, vol. 38, pp. 256-265, 1996.
    • (1996) Technometrics , vol.38 , pp. 256-265
    • Baker, R.D.1
  • 4
    • 0012164473 scopus 로고    scopus 로고
    • New results on goodness-of-fit tests for the power-law process and application to software reliability
    • E. Crétois and O. Gaudoin, "New results on goodness-of-fit tests for the power-law process and application to software reliability," Int. J. Reliab. Qual. Saf. Eng., vol. 5, pp. 249-267, 1998.
    • (1998) Int. J. Reliab. Qual. Saf. Eng. , vol.5 , pp. 249-267
    • Crétois, E.1    Gaudoin, O.2
  • 6
    • 0001782167 scopus 로고
    • Reliability analysis for complex, repairable systems
    • F. Proschan and R. J. Serfling, Eds: SIAM
    • L. H. Crow, "Reliability analysis for complex, repairable systems," in Reliability and Biometry, F. Proschan and R. J. Serfling, Eds: SIAM, 1974, pp. 379-410.
    • (1974) Reliability and Biometry , pp. 379-410
    • Crow, L.H.1
  • 7
    • 0020089190 scopus 로고
    • Confidence interval procedures for the Weibull process with applications to reliability growth
    • _, "Confidence interval procedures for the Weibull process with applications to reliability growth," Technometrics, vol. 24, pp. 67-72, 1982.
    • (1982) Technometrics , vol.24 , pp. 67-72
  • 8
    • 0012129081 scopus 로고    scopus 로고
    • Reliability growth - A new graphical model
    • J. Donovan and E. Murphy, "Reliability growth - A new graphical model," Qual. Reliab. Eng. Int., vol. 15, pp. 167-174, 1999.
    • (1999) Qual. Reliab. Eng. Int. , vol.15 , pp. 167-174
    • Donovan, J.1    Murphy, E.2
  • 9
    • 84937650085 scopus 로고
    • Learning curve approach to reliability monitoring
    • J. T. Duane, "Learning curve approach to reliability monitoring," IEEE Trans. Aerospace, vol. AS-2, pp. 563-566, 1964.
    • (1964) IEEE Trans. Aerospace , vol.AS-2 , pp. 563-566
    • Duane, J.T.1
  • 10
    • 0000899660 scopus 로고
    • Statistical analysis of a compound power-law model for repairable systems
    • M. Engelhardt and L. J. Bain, "Statistical analysis of a compound power-law model for repairable systems," IEEE Trans. Rel., vol. R-36, pp. 392-396, 1987.
    • (1987) IEEE Trans. Rel. , vol.R-36 , pp. 392-396
    • Engelhardt, M.1    Bain, L.J.2
  • 11
    • 84948866199 scopus 로고
    • Confidence bounds on the parameters of the Weibull process
    • J. M. Finkelstein, "Confidence bounds on the parameters of the Weibull process," Technometrics, vol. 18, pp. 115-117, 1976.
    • (1976) Technometrics , vol.18 , pp. 115-117
    • Finkelstein, J.M.1
  • 12
  • 13
    • 0018505572 scopus 로고
    • Time dependent error detection rate model for software reliability and other performance measures
    • A. L. Goel and K. Okumoto, "Time dependent error detection rate model for software reliability and other performance measures," IEEE Trans. Rel., vol. R-28, pp. 206-211, 1979.
    • (1979) IEEE Trans. Rel. , vol.R-28 , pp. 206-211
    • Goel, A.L.1    Okumoto, K.2
  • 14
    • 0026995128 scopus 로고
    • Goodness-of-fit tests for the power-law process based on the TTT-plot
    • B. Klefsjö and U. Kumar, "Goodness-of-fit tests for the power-law process based on the TTT-plot," IEEE Trans. Rel., vol. 41, pp. 593-598, 1992.
    • (1992) IEEE Trans. Rel. , vol.41 , pp. 593-598
    • Klefsjö, B.1    Kumar, U.2
  • 15
    • 0026760051 scopus 로고
    • Reliability analysis of hydraulic systems of LHD machines by using the power law process model
    • U. Kumar and B. Klefsjö, "Reliability analysis of hydraulic systems of LHD machines by using the power law process model," Reliab. Eng. Syst. Saf., vol. 35, pp. 217-222, 1992.
    • (1992) Reliab. Eng. Syst. Saf. , vol.35 , pp. 217-222
    • Kumar, U.1    Klefsjö, B.2
  • 16
    • 0017936779 scopus 로고
    • Some results on inference for the Weibull process
    • L. Lee and S. K. Lee, "Some results on inference for the Weibull process," Technometrics, vol. 20, pp. 41-45, 1978.
    • (1978) Technometrics , vol.20 , pp. 41-45
    • Lee, L.1    Lee, S.K.2
  • 17
    • 0021443966 scopus 로고
    • Rationale for a modified Duane model
    • B. Littlewood, "Rationale for a modified Duane model," IEEE Trans. Rel., vol. R-33, pp. 157-159, 1984.
    • (1984) IEEE Trans. Rel. , vol.R-33 , pp. 157-159
    • Littlewood, B.1
  • 18
    • 0026837006 scopus 로고
    • Goodness-of-fit tests for the power-law process
    • W. J. Park and Y. G. Kim, "Goodness-of-fit tests for the power-law process," IEEE Trans. Rel., vol. 41, pp. 107-111, 1992.
    • (1992) IEEE Trans. Rel. , vol.41 , pp. 107-111
    • Park, W.J.1    Kim, Y.G.2
  • 19
    • 0031099092 scopus 로고    scopus 로고
    • Statistical analysis of a power-law model for repair data
    • W. J. Park and E. H. Pickering, "Statistical analysis of a power-law model for repair data," IEEE Trans. Rel., vol. 46, pp. 27-30, 1997.
    • (1997) IEEE Trans. Rel. , vol.46 , pp. 27-30
    • Park, W.J.1    Pickering, E.H.2
  • 20
    • 0028446682 scopus 로고
    • More goodness-of-fit tests for the power-law process
    • W. J. Park and M. Seoh, "More goodness-of-fit tests for the power-law process," IEEE Trans. Rel., vol. 43, pp. 275-278, 1994.
    • (1994) IEEE Trans. Rel. , vol.43 , pp. 275-278
    • Park, W.J.1    Seoh, M.2
  • 22
    • 0012135262 scopus 로고
    • Estimating the intensity function of a Weibull process at the current time: Failure truncated case
    • S. E. Rigdon and A. P. Basu, "Estimating the intensity function of a Weibull process at the current time: Failure truncated case," J. Stat. Comput. Simul., vol. 30, pp. 17-38, 1988.
    • (1988) J. Stat. Comput. Simul. , vol.30 , pp. 17-38
    • Rigdon, S.E.1    Basu, A.P.2
  • 23
    • 0000391017 scopus 로고
    • The power law process: A model for the reliability of repairable systems
    • _, "The power law process: A model for the reliability of repairable systems," J. Qual. Technol., vol. 21, pp. 251-260, 1989.
    • (1989) J. Qual. Technol. , vol.21 , pp. 251-260
  • 24
    • 0012129082 scopus 로고
    • Estimating the intensity function of a power law process at the current time: Time truncated case
    • _, "Estimating the intensity function of a power law process at the current time: Time truncated case," Communications in Statistics: Simulation and Computation, vol. 19, pp. 1079-1104, 1990.
    • (1990) Communications in Statistics: Simulation and Computation , vol.19 , pp. 1079-1104
  • 25
    • 0032206589 scopus 로고    scopus 로고
    • Estimation of current reliability in a Duane-based reliability growth model
    • A. Sen, "Estimation of current reliability in a Duane-based reliability growth model," Technometrics, vol. 40, pp. 334-344, 1998.
    • (1998) Technometrics , vol.40 , pp. 334-344
    • Sen, A.1
  • 26
    • 0027283137 scopus 로고
    • On some reliability growth models with graphical interpretations
    • M. Xie and M. Zhao, "On some reliability growth models with graphical interpretations," Microelectronics and Reliability, vol. 33, pp. 149-167, 1993.
    • (1993) Microelectronics and Reliability , vol.33 , pp. 149-167
    • Xie, M.1    Zhao, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.