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Volumn 235, Issue 2, 2003, Pages 288-292

Thermo- and galvanomagnetic measurements of semiconductors at ultrahigh pressure

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0037327414     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200301570     Document Type: Conference Paper
Times cited : (7)

References (21)
  • 9
    • 0038673514 scopus 로고    scopus 로고
    • Process, equipment, and materials control in integrated circuit manufacturing IV
    • A. J. Toprac and K. Dang
    • V. V. Shchennikov, in: Process, Equipment, and Materials Control in Integrated Circuit Manufacturing IV, edited by A. J. Toprac and K. Dang, Proc. SPIE 3507, 254 (1998).
    • (1998) Proc. SPIE , vol.3507 , pp. 254
    • Shchennikov, V.V.1
  • 18
    • 0013345438 scopus 로고    scopus 로고
    • Rus. Patent No. 2050180 (1995) (in Russian)
    • V. V. Shchennikov and V. A. Smirnov, Rus. Patent No. 2050180 (1995) (in Russian).
    • Shchennikov, V.V.1    Smirnov, V.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.