Surface observation and depth profiling analysis studies of corrosion products on copper exposed outdoors

Journal of the Electrochemical Society

Volumn 150, Issue 2, 2003, Pages

  Watanabe, Masamitsu ^a   Higashi, Yasuhiro ^a   Ichino, Toshihiro ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COPPER; HOT SPRINGS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; TELECOMMUNICATION EQUIPMENT; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

COASTAL AREAS;

ATMOSPHERIC CORROSION;

EID: 0037324112     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1535203     Document Type: Article

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