Inverse Gaussian control charts for monitoring process variability

Communications in Statistics Part B: Simulation and Computation

Volumn 32, Issue 1, 2003, Pages 223-239

  Sim, C H ^a  

^a UNIVERSITY OF MALAYA   (Malaysia)

Author keywords

Adjusted probability limits; Average run length; Run length distribution; Statistical process control

Indexed keywords

EID: 0037309803     PISSN: 03610918     EISSN: None     Source Type: Journal    
DOI: 10.1081/SAC-120013123     Document Type: Article

References (16)