Discussion on fundamental issues of NPR measurements

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 1, 2003, Pages 197-202

  Geens, Alain ^a   Rolain, Yves ^a   Van Moer, Wendy ^a   Vanhoenacker, Kenneth ^a   Schoukens, Johan ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

Microwave measurements; Noise; Nonlinear systems

Indexed keywords

AMPLIFIERS (ELECTRONIC); GAUSSIAN NOISE (ELECTRONIC); LEAST SQUARES APPROXIMATIONS; NONLINEAR SYSTEMS; WHITE NOISE;

NOISE POWER RATIO (NPR);

MICROWAVE MEASUREMENT;

EID: 0037308952     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2002.808034     Document Type: Article

References (7)

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