Stress-driven morphological instability and catastrophic failure of microdevices

International Journal of Solids and Structures

Volumn 40, Issue 3, 2003, Pages 729-745

  Decuzzi, Paolo ^a   Demelio, Giuseppe P ^a  

^a POLITECNICO DI BARI   (Italy)

Author keywords

Failure; Instability; Propagation

Indexed keywords

CONDENSATION; CRACK PROPAGATION; CRACKS; DIFFUSION; EVAPORATION; INTERFACIAL ENERGY; PERTURBATION TECHNIQUES;

SUPERCRITICAL CRACK PROPAGATION;

SURFACE ROUGHNESS;

FAILURE; MICROELECTRONICS; MORPHOLOGY; STRESS;

EID: 0037305508     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0020-7683(02)00610-8     Document Type: Article

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