Current distribution measurement in YBCO thin film for a superconducting fault current limiter

Cryogenics

Volumn 43, Issue 2, 2003, Pages 111-116

  Shimohata, Kenji ^a   Yokoyama, Shoichi ^a   Inaguchi, Takashi ^a   Nakamura, Shiro ^a   Ozawa, Yasuo ^b  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

^b Super GM   (Japan)

Author keywords

Current distribution; Fault current limiter; HTS film

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; THIN FILMS; YTTRIUM BARIUM COPPER OXIDES;

CURRENT DISTRIBUTION;

SUPERCONDUCTING FILMS;

EID: 0037304672     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0011-2275(03)00048-1     Document Type: Article

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