Characterization of thermal poling in silica glasses by current measurements

Journal of Non-Crystalline Solids

Volumn 316, Issue 2-3, 2003, Pages 338-348

  Godbout, Nicolas ^a   Lacroix, Suzanne ^b  

^a ITF Optical Technologies   (Canada)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELDS; ELECTRODES; NUMERICAL METHODS;

THERMAL POLING;

FUSED SILICA;

EID: 0037302459     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(02)01418-7     Document Type: Article

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