Muon diffusion and trapping in chalcopyrite semiconductors

Physica B: Condensed Matter

Volumn 326, Issue 1-4, 2003, Pages 181-184

  Vilao R C ^a   Gil, J M ^a   Alberto, H V ^a   Piroto Duarte, J ^a   Ayres de Campos, N ^a   Weidinger, A ^b   Yakushev, M V ^c   Cox, S F J ^d  

^a UNIVERSITY OF COIMBRA   (Portugal)

^b HAHN MEITNER INSTITUT   (Germany)

^c UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^d RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Chalcopyrite semiconductors; Muon diffusion; Muon trapping; Structural defects

Indexed keywords

COMPOSITION; DEFECTS; DIFFUSION; SINGLE CRYSTALS;

CHALCOPYRITE SEMICONDUCTORS;

DIAMAGNETIC MATERIALS;

EID: 0037301697     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(02)01598-3     Document Type: Article

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