Trapping effect modeling for SiC power MESFETs

Wuli Xuebao/Acta Physica Sinica

Volumn 52, Issue 2, 2003, Pages 302-

  Yang, Lin An ^a   Zhang, Yi Men ^a   Yu, Chun Li ^a   Zhang, Yu Ming ^a  

^a NONE

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EID: 0037300205     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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