Atomic force microscopy study of sapphire-YAG eutectic fiber

Applied Physics A: Materials Science and Processing

Volumn 76, Issue 2, 2003, Pages 213-217

  Yoshikawa, A ^a,b   Lee, J H ^a   Durbin, S D ^a   Fukuda, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FIBERS; MICROSTRUCTURE; MORPHOLOGY; SAPPHIRE; SCANNING ELECTRON MICROSCOPY;

MELT-GROWTH COMPOSITES;

EUTECTICS;

EID: 0037290908     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390201410     Document Type: Article

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