Measurement of noise characteristics of MEMS accelerometers

Solid-State Electronics

Volumn 47, Issue 2, 2003, Pages 357-360

  Mohd Yasin, Faisal ^a   Korman, Can E ^a   Nagel, David J ^a  

^a The George Washington University   (United States)

Author keywords

1 f noise; MEMS accelerometers; White Gaussian noise

Indexed keywords

ACCELEROMETERS; NATURAL FREQUENCIES; SPURIOUS SIGNAL NOISE; WHITE NOISE;

NOISE SPECTRAL DENSITY;

MICROELECTROMECHANICAL DEVICES;

EID: 0037290334     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00220-4     Document Type: Article

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