-
1
-
-
0000341003
-
Air monitoring by spectroscopic techniques
-
Wiley, New York
-
Air Monitoring by Spectroscopic Techniques, edited by M. W. Sigrist, Chem. Analysis Series, Vol. 127 (Wiley, New York, 1994).
-
(1994)
Chem. Analysis Series
, vol.127
-
-
Sigrist, M.W.1
-
3
-
-
0030225393
-
-
F. G. C. Bijnen, F. J. M. Harren, J. H. P. Hackstein, and J. Reuss, Appl. Opt. 35, 5357 (1996).
-
(1996)
Appl. Opt.
, vol.35
, pp. 5357
-
-
Bijnen, F.G.C.1
Harren, F.J.M.2
Hackstein, J.H.P.3
Reuss, J.4
-
5
-
-
0003863032
-
-
edited by R. A. Meyers, Section "Environment: Trace Gas Monitoring," edited by M. W. Sigrist (Wiley, Chichester, UK)
-
M. Tacke, F. Wienhold, R. Grisar, H. Fischer, and F.-J. Lübken, in Encyclopedia of Analytical Chemistry, edited by R. A. Meyers, Vol. 3, Section "Environment: Trace Gas Monitoring," edited by M. W. Sigrist (Wiley, Chichester, UK, 2000), pp. 2033-2065.
-
(2000)
Encyclopedia of Analytical Chemistry
, vol.3
, pp. 2033-2065
-
-
Tacke, M.1
Wienhold, F.2
Grisar, R.3
Fischer, H.4
Lübken, F.-J.5
-
6
-
-
0036466889
-
-
P. Werle, F. Slemr, K. Maurer, R. Kormann, R. Mücke, and B. Jänker, Opt. Lasers Eng. 37, 101 (2002).
-
(2002)
Opt. Lasers Eng.
, vol.37
, pp. 101
-
-
Werle, P.1
Slemr, F.2
Maurer, K.3
Kormann, R.4
Mücke, R.5
Jänker, B.6
-
7
-
-
0028304539
-
-
J. Faist, F. Capasso, D. L. Sivco, C. Sirtori, A. L. Hutchinson, and A. Y. Cho, Science 264, 553 (1994).
-
(1994)
Science
, vol.264
, pp. 553
-
-
Faist, J.1
Capasso, F.2
Sivco, D.L.3
Sirtori, C.4
Hutchinson, A.L.5
Cho, A.Y.6
-
8
-
-
0037059498
-
-
M. Beck, D. Hofstetter, T. Aellen, J. Faist, U. Oesterle, M. Ilegems, E. Gini, and H. Melchior, Science 295, 301 (2002).
-
(2002)
Science
, vol.295
, pp. 301
-
-
Beck, M.1
Hofstetter, D.2
Aellen, T.3
Faist, J.4
Oesterle, U.5
Ilegems, M.6
Gini, E.7
Melchior, H.8
-
10
-
-
0001338348
-
-
Air Monitoring by Spectroscopic Techniques, edited by M. W. Sigrist, (Wiley, New York), Chap. 5
-
H. I. Schiff, G. I. Mackay, and J. Bechara, in Air Monitoring by Spectroscopic Techniques, edited by M. W. Sigrist, Chem. Analysis Series, Vol. 127 (Wiley, New York, 1994), Chap. 5.
-
(1994)
Chem. Analysis Series
, vol.127
-
-
Schiff, H.I.1
Mackay, G.I.2
Bechara, J.3
-
11
-
-
0013331103
-
-
Air Monitoring by Spectroscopic Techniques, edited by M. W. Sigrist, (Wiley, New York), Chap. 4
-
M. W. Sigrist, in Air Monitoring by Spectroscopic Techniques, edited by M. W. Sigrist, Chem. Analysis Series, Vol. 127 (Wiley, New York, 1994), Chap. 4.
-
(1994)
Chem. Analysis Series
, vol.127
-
-
Sigrist, M.W.1
-
13
-
-
0000052416
-
-
edited by R. A. Meyers, Section "Environment: Trace Gas Monitoring," edited by M. W. Sigrist (Wiley, Chichester, UK)
-
F. J. M. Harren, G. Cotti, J. Oomens, and S. te Lintel Hekkert, in Encyclopedia of Analytical Chemistry, edited by R. A. Meyers, Vol. 3, Section "Environment: Trace Gas Monitoring," edited by M. W. Sigrist (Wiley, Chichester, UK, 2000), pp. 2203-2226.
-
(2000)
Encyclopedia of Analytical Chemistry
, vol.3
, pp. 2203-2226
-
-
Harren, F.J.M.1
Cotti, G.2
Oomens, J.3
Te Lintel Hekkert, S.4
-
16
-
-
0033699996
-
-
M. W. Sigrist, A. Bohren, I. G. Calasso, M. Nägele, and A. Romann, Proc. SPIE 3916, 286 (2000).
-
(2000)
Proc. SPIE
, vol.3916
, pp. 286
-
-
Sigrist, M.W.1
Bohren, A.2
Calasso, I.G.3
Nägele, M.4
Romann, A.5
-
18
-
-
0031561556
-
-
D. Romanini, A. Kachanov, N. Sadeghi, and F. Stoeckel, Chem. Phys. Lett. 264, 316 (1997).
-
(1997)
Chem. Phys. Lett.
, vol.264
, pp. 316
-
-
Romanini, D.1
Kachanov, A.2
Sadeghi, N.3
Stoeckel, F.4
-
20
-
-
0000899797
-
-
R. Engeln, G. Berden, R. Peeters, and G. Meijer, Rev. Sci. Instrum. 69, 3763 (1998).
-
(1998)
Rev. Sci. Instrum.
, vol.69
, pp. 3763
-
-
Engeln, R.1
Berden, G.2
Peeters, R.3
Meijer, G.4
-
21
-
-
0036506651
-
-
A. Boschetti, D. Bassi, E. Iacob, S. Iannotta, L. Ricci, and M. Scotoni, Appl. Phys. B: Lasers Opt. 74, 273 (2002).
-
(2002)
Appl. Phys. B: Lasers Opt.
, vol.74
, pp. 273
-
-
Boschetti, A.1
Bassi, D.2
Iacob, E.3
Iannotta, S.4
Ricci, L.5
Scotoni, M.6
-
22
-
-
0034807561
-
-
H. Dahnke, D. Kleine, P. Hering, and M. Mürtz, Appl. Phys. B: Lasers Opt. 72, 971 (2001).
-
(2001)
Appl. Phys. B: Lasers Opt.
, vol.72
, pp. 971
-
-
Dahnke, H.1
Kleine, D.2
Hering, P.3
Mürtz, M.4
-
23
-
-
84975674561
-
-
H. Sauren, D. Bicanic, W. Hillen, H. Jalink, C. Van Asselt, J. Quist, and J. Reuss, Appl. Opt. 29, 2679 (1990).
-
(1990)
Appl. Opt.
, vol.29
, pp. 2679
-
-
Sauren, H.1
Bicanic, D.2
Hillen, W.3
Jalink, H.4
Van Asselt, C.5
Quist, J.6
Reuss, J.7
-
25
-
-
0036407417
-
-
M. W. Sigrist, M. Nägele, D. Lauchenauer, R. Hollmann, and E. Kammer, Proc. SPIE 4618, 114 (2002).
-
(2002)
Proc. SPIE
, vol.4618
, pp. 114
-
-
Sigrist, M.W.1
Nägele, M.2
Lauchenauer, D.3
Hollmann, R.4
Kammer, E.5
-
29
-
-
11744308449
-
-
S. W. Sharpe, J. F. Kelly, J. S. Hartman, C. Gmachl, F. Capasso, D. L. Sivco, J. N. Baillargeon, and A. Y. Cho, Opt. Lett. 23, 1396 (1998).
-
(1998)
Opt. Lett.
, vol.23
, pp. 1396
-
-
Sharpe, S.W.1
Kelly, J.F.2
Hartman, J.S.3
Gmachl, C.4
Capasso, F.5
Sivco, D.L.6
Baillargeon, J.N.7
Cho, A.Y.8
-
30
-
-
0000610248
-
-
B. Paldus, T. G. Spence, R. N. Zare, J. Oomens, F. J. M. Harren, D. H. Parker, C. Gmachl, F. Capasso, D. L. Sivco, J. N. Ballairgeon, A. L. Hutchinson, and A. Y. Cho, Opt. Lett. 24, 178 (1999).
-
(1999)
Opt. Lett.
, vol.24
, pp. 178
-
-
Paldus, B.1
Spence, T.G.2
Zare, R.N.3
Oomens, J.4
Harren, F.J.M.5
Parker, D.H.6
Gmachl, C.7
Capasso, F.8
Sivco, D.L.9
Ballairgeon, J.N.10
Hutchinson, A.L.11
Cho, A.Y.12
-
31
-
-
0036627850
-
-
G. Gagliardi, F. Tamassia, P. De Natate, C. Gmachl, F. Capasso, D. L. Sivco, J. N. Baillargeon, A. L. Hutchinson, and A. Y. Cho, Eur. Phys. J. D 19, 327 (2002).
-
(2002)
Eur. Phys. J. D
, vol.19
, pp. 327
-
-
Gagliardi, G.1
Tamassia, F.2
De Natate, P.3
Gmachl, C.4
Capasso, F.5
Sivco, D.L.6
Baillargeon, J.N.7
Hutchinson, A.L.8
Cho, A.Y.9
-
33
-
-
0034741096
-
-
L. Menzel, A. A. Kosterev, R. F. Curl, F. K. Tittel, C. Gmachl, F. Capasso, D. L. Sivco, J. N. Baillargeon, A. L. Hutchinson, A. Y. Cho, and W. Urban, Appl. Phys. B: Lasers Opt. 72, 859 (2001).
-
(2001)
Appl. Phys. B: Lasers Opt.
, vol.72
, pp. 859
-
-
Menzel, L.1
Kosterev, A.A.2
Curl, R.F.3
Tittel, F.K.4
Gmachl, C.5
Capasso, F.6
Sivco, D.L.7
Baillargeon, J.N.8
Hutchinson, A.L.9
Cho, A.Y.10
Urban, W.11
-
34
-
-
0001092650
-
-
D. Hofstetter, M. Beck, J. Faist, M. Nägele, and M. W. Sigrist, Opt. Lett. 26, 887 (2001).
-
(2001)
Opt. Lett.
, vol.26
, pp. 887
-
-
Hofstetter, D.1
Beck, M.2
Faist, J.3
Nägele, M.4
Sigrist, M.W.5
-
36
-
-
0032097864
-
-
F. Kühnemann, K. Schneider, A. Hecker, A. A. E. Martis, W. Urban, S. Schiller, and J. Mlynek, Appl. Phys. B: Lasers Opt. 66, 741 (1998).
-
(1998)
Appl. Phys. B: Lasers Opt.
, vol.66
, pp. 741
-
-
Kühnemann, F.1
Schneider, K.2
Hecker, A.3
Martis, A.A.E.4
Urban, W.5
Schiller, S.6
Mlynek, J.7
-
37
-
-
0037091934
-
-
M. v. Herpen, S. te Lintel Hekkert, S. E. Bisson, and F. J. M. Harren, Opt. Lett. 27, 640 (2002).
-
(2002)
Opt. Lett.
, vol.27
, pp. 640
-
-
Herpen, M.V.1
Te Lintel Hekkert, S.2
Bisson, S.E.3
Harren, F.J.M.4
-
38
-
-
0034741095
-
-
D. Rehle, D. Leleux, M. Erdelyi, F. Tittel, M. Fraser, and S. Friedfeld, Appl. Phys. B: Lasers Opt. 72, 947 (2001).
-
(2001)
Appl. Phys. B: Lasers Opt.
, vol.72
, pp. 947
-
-
Rehle, D.1
Leleux, D.2
Erdelyi, M.3
Tittel, F.4
Fraser, M.5
Friedfeld, S.6
-
39
-
-
0036466992
-
-
D. Richter, M. Erdelyi, R. F. Curl, F. K. Tittel, C. Oppenheimer, H. J. Duffell, and M. Burton, Opt. Lasers Eng. 37, 171 (2002).
-
(2002)
Opt. Lasers Eng.
, vol.37
, pp. 171
-
-
Richter, D.1
Erdelyi, M.2
Curl, R.F.3
Tittel, F.K.4
Oppenheimer, C.5
Duffell, H.J.6
Burton, M.7
|