Optical properties of TiO2 thin films estimated by photothermal deflection spectroscopy

Review of Scientific Instruments

Volumn 74, Issue 1 II, 2003, Pages 863-865

  Ogawa, S ^a   Mori, K ^a   Natsuhara, H ^a   Ohashi, T ^a   Sakakiyama, R ^a   Itoh, T ^a   Yoshida, N ^a   Nonomura, S ^a   Fukawa, M ^b   Sato, K ^b  

^a GIFU UNIVERSITY   (Japan)

^b ASAHI GLASS CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; HEAT RADIATION; OPTICAL PROPERTIES; PARAMAGNETIC RESONANCE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SOLAR CELLS; TITANIUM OXIDES; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOTHERMAL DEFLECTION SPECTROSCOPY;

THIN FILMS;

EID: 0037283928     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1517149     Document Type: Conference Paper

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