Determining the optimum process mean under the bivariate quality characteristics

International Journal of Advanced Manufacturing Technology

Volumn 21, Issue 5, 2003, Pages 313-316

  Chen, C H ^a   Chou, C Y ^b  

^a SOUTHERN TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Correlation coefficient; Multivariate quality loss function; Process mean; Process standard deviation; Target value

Indexed keywords

CORRELATION METHODS; COSTS; FITS AND TOLERANCES; PROCESS CONTROL; SPECIFICATIONS;

CORRELATION COEFFICIENT; MULTIVARIATE QUALITY LOSS FUNCTION; PROCESS STANDARD DEVIATION;

QUALITY ASSURANCE;

EID: 0037279925     PISSN: 02683768     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001700300036     Document Type: Article

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