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Volumn 9, Issue 1, 2003, Pages 83-91

Note on reliability of a system complexity considering entropy

Author keywords

Complexity; Entropy; Networks; Reliability

Indexed keywords

COMPUTATIONAL METHODS; ENTROPY; FUNCTIONS; OPTIMIZATION; RELIABILITY;

EID: 0037275794     PISSN: 13552511     EISSN: None     Source Type: Journal    
DOI: 10.1108/13552510310466990     Document Type: Article
Times cited : (7)

References (14)
  • 1
    • 84941446735 scopus 로고
    • Computational complexity of network reliability analysis: An overview
    • Ball, M.O. (1986), "Computational complexity of network reliability analysis: an overview", IEEE Transactions on Reliability, Vol. R-35, pp. 230-9.
    • (1986) IEEE Transactions on Reliability , vol.R-35 , pp. 230-239
    • Ball, M.O.1
  • 4
    • 0017969063 scopus 로고
    • Path complexity of logic networks
    • Hayes, J.P. (1978), "Path complexity of logic networks", IEEE Transactions on Computers, Vol. C-27, pp. 459-62.
    • (1978) IEEE Transactions on Computers , vol.C-27 , pp. 459-462
    • Hayes, J.P.1
  • 7
    • 0021502568 scopus 로고
    • Adaptive probability distribution estimation based upon maximum entropy
    • Miller, J.E. Jr, Kulp, R.W. and Orr, G.E. (1984), "Adaptive probability distribution estimation based upon maximum entropy", IEEE Transactions on Reliability, Vol. R-33, pp. 353-7.
    • (1984) IEEE Transactions on Reliability , vol.R-33 , pp. 353-357
    • Miller J.E., Jr.1    Kulp, R.W.2    Orr, G.E.3
  • 11
    • 0004195148 scopus 로고    scopus 로고
    • Institute of Electrical and Electronic Engineers, Inc., New York, NY
    • Pukite, J. and Pukite, P. (1998), Modeling for Reliability Analysis, Institute of Electrical and Electronic Engineers, Inc., New York, NY.
    • (1998) Modeling for Reliability Analysis
    • Pukite, J.1    Pukite, P.2
  • 14
    • 0024032593 scopus 로고
    • A comparison of algorithms for terminal-pair reliability
    • Yoo, Y.B. and Deo, N. (1988), "A comparison of algorithms for terminal-pair reliability", IEEE Transactions on Reliability, Vol. 37, pp. 210-15.
    • (1988) IEEE Transactions on Reliability , vol.37 , pp. 210-215
    • Yoo, Y.B.1    Deo, N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.