AFM and SEM: Competing or complementary techniques?

Materials Science Forum

Volumn 414-415, Issue , 2003, Pages 241-252

  Kalman E ^a,b   Nagy, P ^a   Csanady A ^b   Papp, K ^a   Csorbai, H K ^a,b   Hunyadi, Cs ^a   Telegdi, J ^a  

^a CHEMICAL RESEARCH CENTER   (Hungary)

^b BAY ZOLTÁN NONPROFIT LTD FOR APPLIED RESEARCH   (Hungary)

Author keywords

AFM; Environmental electron microscope; SEM; SPM

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

IMAGE DIMENSIONS;

ELECTRON MICROSCOPES;

EID: 0037275180     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.414-415.241     Document Type: Conference Paper

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