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Volumn 57, Issue 1, 2003, Pages

Quantitative analysis using Raman spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR STRUCTURE; OPTICAL RESOLVING POWER; PHOTONS; PRINCIPAL COMPONENT ANALYSIS; RAMAN SCATTERING; REGRESSION ANALYSIS; SHOT NOISE; SPECTROMETRY;

EID: 0037274992     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370203321165133     Document Type: Review
Times cited : (347)

References (88)
  • 1
    • 0001668590 scopus 로고
    • Rayleigh-Streuung und Raman-effekt in handbuch der radiologie
    • E. Marx, Ed. (Leipzig), vol VI.2, . Translation: The Rayleigh and Raman Scattering (University of California Radiation Laboratory (UCRL), trans 526(L), 1962)
    • G. Placzek, "Rayleigh-Streuung und Raman-Effekt in Handbuch der Radiologie", in Acadeische-Verlag, E. Marx, Ed. (Leipzig, 1934), vol VI.2, pp. 205. Translation: The Rayleigh and Raman Scattering (University of California Radiation Laboratory (UCRL), trans 526(L), 1962).
    • (1934) Acadeische-Verlag , pp. 205
    • Placzek, G.1
  • 5
    • 0013271052 scopus 로고
    • Philadelphia, PA
    • Sadtler Research Laboratories Raman Spectra. A collection of 4400 Raman spectra, Philadelphia, PA (1973-1976).
    • (1973) A Collection of 4400 Raman Spectra
  • 9
    • 0003804516 scopus 로고    scopus 로고
    • Galactic, Salem, NH
    • Galactic Industries Corporation, PLSplus/IQ User's Guide (Galactic, Salem, NH, 1997), p. 85.
    • (1997) PLSplus/IQ User's Guide , pp. 85
  • 51
    • 0013229598 scopus 로고
    • Emission spectroscopy
    • I. M. Kolthoff and P. J. Elving, Eds., John Wiley and Sons, New York, Chap. 64
    • B. F. Scribner and M. Margoshes, "Emission Spectroscopy", in Treatise on Analytical Chemistry, I. M. Kolthoff and P. J. Elving, Eds. (John Wiley and Sons, New York, 1965), part I, vol. 6, Chap. 64.
    • (1965) Treatise on Analytical Chemistry , vol.6 , Issue.PART I
    • Scribner, B.F.1    Margoshes, M.2
  • 61
    • 0002113574 scopus 로고
    • Characterization of semiconductors by Raman spectroscopy
    • J. G. Grasselli and B. J. Bulkin, Eds., John Wiley and Sons, New York
    • F. H. Pollak, "Characterization of Semiconductors by Raman Spectroscopy", in Analytical Raman Spectroscopy, J. G. Grasselli and B. J. Bulkin, Eds. (John Wiley and Sons, New York, 1991), pp. 172-174.
    • (1991) Analytical Raman Spectroscopy , pp. 172-174
    • Pollak, F.H.1
  • 62
    • 0013288704 scopus 로고    scopus 로고
    • Semiconductors
    • M. J. Pelletier, Ed., Blackwell Science, Oxford
    • I. DeWolf, "Semiconductors", in Analytical Applications of Raman Spectroscopy, M. J. Pelletier, Ed. (Blackwell Science, Oxford, 1999), pp. 463-469.
    • (1999) Analytical Applications of Raman Spectroscopy , pp. 463-469
    • Dewolf, I.1
  • 74
    • 0013315829 scopus 로고
    • Computerized infrared: The need for caution
    • G. L. McClure, Ed., ASTM
    • T. Hirschfeld, "Computerized Infrared: The Need for Caution", in Computerized Quantitative Infrared Analysis, G. L. McClure, Ed. (ASTM, 1984), pp. 169-179.
    • (1984) Computerized Quantitative Infrared Analysis , pp. 169-179
    • Hirschfeld, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.