Reflectometry in soft X-ray and EUV-ranges

Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya

Volumn , Issue 1, 2003, Pages 70-78

  Bidishkin, M S ^a   Zabrodin, I G ^a   Zuev, S Yu ^a   Klyuenkov, E B ^a   Salashchenko, N N ^a   Chekhonadskikh, D P ^a   Chkhalo, N I ^a   Shmaenok, L A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037273589     PISSN: 02073528     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)