Accelerated testing for demonstration of product lifetime reliability

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2003, Pages 117-123

  Krasich, Milena ^a  

^a Bose Corporation   (United States)

Author keywords

Demonstrated reliability; Load; Product life; Strength; Test acceleration; Test sample size; Usage profile

Indexed keywords

FAILURE (MECHANICAL); FAILURE ANALYSIS; PRODUCT DESIGN; PRODUCT DEVELOPMENT; SERVICE LIFE;

DEMONSTRATED RELIABILITY; PRODUCT LIFE; TEST ACCELERATION; USAGE PROFILE;

RELIABILITY;

EID: 0037255955     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Alfredo H.-S. Ang and Wilson H. Tang "Probability Concepts in Engineering Planning and Design, Volume II, Decision Risk and Reliability", 1990.
2. Shu-Ho Dai, Ming-O Wang, "Reliability Analysis in Engineering Applications" Van Nostrand Reinhold 1992.
3. IEC61014,Programmes for reliability growth
4. IEC 61164, Statistical Methods for reliability growth
5. IEC 60300-3-1. Dependability methods, 2002.