Cost effective accelerated testing

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2003, Pages 106-110

  Misra, Ravindra B ^a   Vyas, B M ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b Secure Meters Ltd   (India)

Author keywords

ALT; HALT; HASS; HAST

Indexed keywords

COST EFFECTIVENESS; PRODUCT DESIGN; PRODUCT DEVELOPMENT; QUALITY ASSURANCE;

HIGHLY ACCELERATED LIFE TEST; HIGHLY ACCELERATED STRESS TEST;

RELIABILITY;

EID: 0037255888     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. G. K. Hobbs, Accelerated Reliability Engineering: HALT and HASS, 2000, John Wiley and Sons.
2. H. W. McLean, HALT, HASS and HASSA explained: Accelerated Reliability Techniques, 2000, American Society for Quality.