Transversal-readout architecture for CMOS active pixel image sensors

IEEE Transactions on Electron Devices

Volumn 50, Issue 1, 2003, Pages 121-129

  Miyatake, Shigehiro ^a   Miyamoto, Masaru ^a   Ishida, Koichi ^a   Morimoto, Takashi ^a   Masaki, Yasuo ^b   Tanabe, Hideki ^b  

^a Konica Corporation   (Japan)

^b Gazoh System Kaihatsu Inc   (Japan)

Author keywords

Active pixel sensors (APSs); Cameras; CMOS image sensors

Indexed keywords

CAMERAS; CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT LAYOUT; PHOTODIODES; PHOTOTRANSISTORS; SPURIOUS SIGNAL NOISE;

ACTIVE PIXEL SENSORS; FIXED PATTERN NOISE;

IMAGE SENSORS;

EID: 0037253051     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2002.806960     Document Type: Article

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