Removal of undesired wavefields related to the casing of a microwave scanner

IEEE Transactions on Microwave Theory and Techniques

Volumn 51, Issue 1 I, 2003, Pages 187-192

  Van den Berg, Peter M ^a   Fokkema, Jacob T ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Inverse scattering; Microwave scanner; Reciprocity

Indexed keywords

ELECTROMAGNETIC FIELD MEASUREMENT; FAST FOURIER TRANSFORMS; HARMONIC ANALYSIS; LINEAR EQUATIONS; MICROWAVE MEASUREMENT;

MICROWAVE SCANNER; RAYLEIGH RECIPROCITY THEOREM; UNDESIRED WAVEFIELD REMOVAL;

RAYLEIGH SCATTERING;

EID: 0037251040     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2002.806900     Document Type: Article

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