Thin film hydroxyapatite as a model dental surface

Key Engineering Materials

Volumn 240-242, Issue , 2003, Pages 295-298

  Turkington, M ^a   Joiner, A ^b   Meenan, B J ^a  

^a UNIVERSITY OF ULSTER   (United Kingdom)

^b UNILEVER RESEARCH   (United Kingdom)

Author keywords

AFM; Dental Enamel; Dissolution; FTIR; Hydroxyapatite; Microhardness; Nanohardness; PBS; RF Magnetron Sputtering; Toothpaste; Wear; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; ENAMELS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MAGNETRON SPUTTERING; MICROHARDNESS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

DENTAL ENAMELS;

HYDROXYAPATITE;

EID: 0037246955     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/kem.240-242.295     Document Type: Conference Paper

References (5)

1. A.C. Shortall et al: Dental Materials Vol. 18 (2002), p. 246-254
2. J. Arends et al: J. Crystal Growth Vol. 53 (1981), p. 135-147
3. T. Jaeggi et al: Caries Research Vol. 33 (1999), p. 455-461
4. K. Collys et al: Dental Materials Vol. 8 (1992), p. 332-335
5. S. Habelitz: Archives of Oral Biology Vol. 46 (2001), p. 173-183