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Volumn 14, Issue 1, 2003, Pages 32-37

Component rework: A small world and getting smaller

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; COMPUTER SOFTWARE; PRINTED CIRCUIT BOARDS; SEMICONDUCTOR DEVICE MANUFACTURE; THERMOCOUPLES;

EID: 0037246342     PISSN: 10540407     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (6)
  • 2
    • 0012775883 scopus 로고    scopus 로고
    • Thermal process development for rework using auto profile software
    • Anaheim, CA, February
    • D. Naugler, "Thermal Process Development for Rework Using Auto Profile Software," Proceedings of NEPCON West 2000, Anaheim, CA, Volume 1, p. 20-29, February 2000.
    • (2000) Proceedings of NEPCON West 2000 , vol.1 , pp. 20-29
    • Naugler, D.1
  • 3
    • 0012777237 scopus 로고    scopus 로고
    • Kapton® is a high temperature polyimide film tape and is a registered trademark of the DuPont Company
    • Kapton® is a high temperature polyimide film tape and is a registered trademark of the DuPont Company.
  • 4
    • 0012778105 scopus 로고    scopus 로고
    • Omega type SA-1-SC with self-adhesive removed
    • Omega type SA-1-SC with self-adhesive removed.
  • 5
    • 0012879754 scopus 로고    scopus 로고
    • This technique was correlated in prior work by comparing the thermocouple responses of a 5-mil TC epoxied in a hole drilled in the board beneath a μSMD and comparing the TC response to the .0005" foil TC taped to a bare site beneath differing layers of Kapton tape.
    • This technique was correlated in prior work by comparing the thermocouple responses of a 5-mil TC epoxied in a hole drilled in the board beneath a μSMD and comparing the TC response to the .0005" foil TC taped to a bare site beneath differing layers of Kapton tape.
  • 6
    • 0012780395 scopus 로고    scopus 로고
    • PhD., Department of System Science and Industrial Engineering, State University of New York, December
    • Parvez M.S. Patel and K. Srihari, PhD., "Process Overview-Rework of Chip Scale Packages," Department of System Science and Industrial Engineering, State University of New York, December 1998.
    • (1998) Process Overview-Rework of Chip Scale Packages
    • Patel, P.M.S.1    Srihari, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.